数字系统测试和可测性设计(影印版)/国外大学优秀教材

    Digital Systems Testing and Testable Design一书，是全美大学生和研究生优秀教材，比较系统地介绍了结构测试的理论和方法、可测性设计理论和度量方法、测试数据的处理及简化的理论和方法以及智能芯片(处理器、数字信号处理器和自动机等)测试理论和方法等。该书共有15章，分为3部分。前8章为第一部分，主要介绍数字系统、数字微系统芯片缺陷的来源、逻辑描述的方法——故障的建模、故障模拟、测试单固定故障、测试桥接故障、智能数字系统的功能测试及其范围等；第9章～第14章是第二部分，主要介绍数字系统的可测性设计理论和方法、建内自测试BIST测试数据压缩方法等现代测试理论和方法；第15章足第三部分，主要讨论系统测试的方法。该书概念清晰层次分明、定义和证明准确、算法推导和阐述简练。每章附有大量练习题可帮助读者对于概念的消化吸收。

    

PREFACE
How This Book Was Written
1.INTRODUCTION
2.MODELING
2.1 Basic concepts
2.2 Functional Modeling at Logic level
2.2.1 Truth Tables and Primitive Cubes
2.2.2 State Tables and Flow Tables
2.2.3 Binary Deision Diagrams
2.2.4 Programs as Functional Models
2.3 functional Modeling at the Register Level
2.3.1 Basic RTL Constructs
2.3.2 Timing Modeling in RTLs
2.3.3 Internal RTL Models
2.4 Structural Models
2.4.1 External Representation
2.4.2 Structural Properties
2.4.3 Internal Representation
2.4.4 Wired Logic and Bibirectionality
2.5 level of Modeling
REFERENCES
PROBLEMS
3.LOGIC SIMULATION
3.1 Applications
3.2 Problems in simulation-Based Design Verification
3.3 Type of simulation
3.4 The Unknown Logic Value
3.5 compiled simulation
3.6 Event-Driven Simulation
3.7 Delay Models
3.7.1 Delay Modeling for Gates
3.7.2 Dealy Modeling for Functional Elements
3.7.3 Delay Modeling in RTLs
3.7.4 Other Aspects of Delay Modeling
3.8 Elemnent Evaluation
3.9 Hazard Detection
3.10 Gate-Level Event-Driven simulation
3.11 Simulation Engines
REFERENCES
PROBLEMS
4. FAULT MODELING
5.FAULT SIMULATION
6.TESTING FOR SINGLE STUCK FAULTS
7.TESTING FOR BRIDGING FAULTS
8.FUNCTIONAL TESTING
9.DESING FOR TESTABILITY
10.COMPRESSION TECHNIQUES
11.BUILT-IN SELF-TEST
12.LOGIC-LEVEL DIAGNOSIS
13.SELF-CHECKING DESIGN
14.PLA TESTING
15.SYSTEM-LEVEL DIAGNOSIS
INDEX